This inventor holds 1 USPTO granted patent. Top assignee: United Technologies Corporation. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: The Innovative Mind of Jeffrey K. Pearson
Introduction
Jeffrey K. Pearson is a notable inventor based in Newport Beach, California. He has made significant contributions to the field of measurement technology, particularly in the area of coating thickness measurement. His innovative approach combines advanced imaging techniques with practical applications in various industries.
Latest Patents
One of Jeffrey K. Pearson's key patents is titled "Method and system for measuring a coating thickness." This patent describes a method that involves projecting a pattern of light onto a surface. The first reflection of this pattern is captured by a first image capturing device, while a second reflection is received by either the same or a different image capturing device. By comparing these reflections, a first data map of the surface is created. After a coating is deposited on the surface, a second data map is generated, allowing for the determination of the coating's thickness through comparison of the two data maps. This innovative method enhances accuracy in measuring coating thickness, which is crucial in various manufacturing processes.
Career Highlights
Jeffrey K. Pearson is currently associated with United Technologies Corporation, where he applies his expertise in measurement technologies. His work has contributed to advancements in the field, showcasing his commitment to innovation and excellence.
Collaborations
Throughout his career, Jeffrey has collaborated with talented individuals such as Jesse R. Boyer and Randall Joyner. These collaborations have fostered a creative environment that encourages the development of groundbreaking technologies.
Conclusion
In summary, Jeffrey K. Pearson is a distinguished inventor whose work in measuring coating thickness has made a significant impact in the industry. His innovative methods and collaborations continue to drive advancements in measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
