The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Jun. 02, 2008
Jesse R. Boyer, Berlin, CT (US);
Gene P. Allocca, Kensington, CT (US);
Randall W. Joyner, Union, CT (US);
Jeffrey K. Pearson, Newport Beach, CA (US);
Jesse R. Boyer, Berlin, CT (US);
Gene P. Allocca, Kensington, CT (US);
Randall W. Joyner, Union, CT (US);
Jeffrey K. Pearson, Newport Beach, CA (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
A method of measuring a coating thickness involves projecting a pattern of light on a surface. A first reflection of the pattern of light is received by a first image capturing device. A second reflection of the pattern of light is received by an image capturing device which may be the same or a different image capturing device. The first reflection is compared with the second reflection. A first dated map of the surface is created by comparing the first reflection and the second reflection. A coating is deposited on the surface. A second data map of the surface with the coating is created by comparing reflections. The first data map and the second data map are then compared to determine a thickness of the coating.