Jeffrey Illig

Title: The Innovative Contributions of Jeffrey Illig

Introduction

Jeffrey Illig is a notable inventor based in Verona, Wisconsin, recognized for his contributions to the field of x-ray inspection technology. With a focus on enhancing the efficiency and effectiveness of x-ray systems, Illig has made significant strides in innovation.

Latest Patents

Illig holds a patent for a "Convertible scan panel for x-ray inspection." This invention involves an x-ray inspection system that utilizes backscatter from an x-ray beam emitted through a scan panel. The scan panel is designed to be contiguous with, yet distinct from, the enclosure containing the x-ray source. The unique contour of the scan panel allows it to blend visually with the shape of the enclosure. In certain embodiments, the x-ray beam can traverse multiple scan panels, with options for beam filtration properties. Additionally, the scan panel may be positioned interior to a sliding door and structured to function as a scatter shield.

Career Highlights

Illig's career is marked by his work at American Science and Engineering, Inc., where he has contributed to advancements in x-ray technology. His innovative approach has led to the development of systems that improve safety and accuracy in x-ray inspections.

Collaborations

Throughout his career, Illig has collaborated with notable colleagues, including Jeffrey R. Schubert and Jeffrey M. Denker. These partnerships have fostered a creative environment that encourages the exchange of ideas and technological advancements.

Conclusion

Jeffrey Illig's contributions to x-ray inspection technology exemplify the impact of innovation in enhancing safety and efficiency. His patent for the convertible scan panel showcases his commitment to advancing the field, making him a significant figure in the realm of inventions.