American Science and Engineering, Inc.

Jeffrey Illig

Jeffrey R Schubert

Richard Mastronardi

Jeffrey M Denker

Richard Schueller

Michael Chesna

Jason Toppan

Robyn Smith

An x-ray inspection system using backscatter of an x-ray beam emitted through a scan panel contiguous with, but of a material distinct from, an enclosure that contains an x-ray source by which the x-ray beam is generated. The scan panel is contoured in such a manner as to be visibly blended with a shape characterizing the enclosure. In some embodiments, the beam traverses multiple scan panels, where one or more of the scan panels may be selected for beam filtration properties. The scan panel may be disposed interior to a sliding door, and may be structured to serve as a scatter shield.

Convertible scan panel for x-ray inspection

Growing community of inventors

Verona, WI, United States of America

Jeffrey Illig