The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Jan. 23, 2013
American Science and Engineering, Inc., Billerica, MA (US);
Jeffrey Schubert, Somerville, MA (US);
Jeffrey M. Denker, Woburn, MA (US);
Jason Toppan, Burlington, MA (US);
Michael Chesna, Saugus, MA (US);
Richard Mastronardi, Medfield, MA (US);
Robyn Smith, Bolton, MA (US);
Richard Schueller, Chemsford, MA (US);
Jeffrey Illig, Verona, WI (US);
American Science and Engineering, Inc., Billerica, MA (US);
Abstract
An x-ray inspection system using backscatter of an x-ray beam emitted through a scan panel contiguous with, but of a material distinct from, an enclosure that contains an x-ray source by which the x-ray beam is generated. The scan panel is contoured in such a manner as to be visibly blended with a shape characterizing the enclosure. In some embodiments, the beam traverses multiple scan panels, where one or more of the scan panels may be selected for beam filtration properties. The scan panel may be disposed interior to a sliding door, and may be structured to serve as a scatter shield.