Company Filing History:
Years Active: 2015-2020
Title: Jason Toppan: Innovator in X-ray Inspection Technology
Introduction
Jason Toppan is a notable inventor based in Burlington, MA (US). He has made significant contributions to the field of x-ray inspection technology, holding a total of 2 patents. His innovative work focuses on enhancing the efficiency and effectiveness of x-ray scanning systems.
Latest Patents
Toppan's latest patents include "Mobile x-ray scan speed control" and "Convertible scan panel for x-ray inspection." The first patent describes a conveyance system designed for x-ray inspection of objects. This system features a bed with attached wheels and detector elements arranged along a pontine structure. A source of penetrating radiation is integrated into the conveyance, allowing for efficient irradiation of the detector elements from a single position. The automated manual transmission connects power from an engine to the wheels, facilitating both road travel and x-ray inspection.
The second patent, "Convertible scan panel for x-ray inspection," outlines an x-ray inspection system that utilizes backscatter from an x-ray beam emitted through a scan panel. This panel is made of a material distinct from the enclosure containing the x-ray source. The design of the scan panel is contoured to blend visually with the shape of the enclosure. In certain embodiments, the x-ray beam can traverse multiple scan panels, with options for beam filtration properties. Additionally, the scan panel may be positioned within a sliding door and structured to function as a scatter shield.
Career Highlights
Jason Toppan is currently employed at American Science and Engineering, Inc., where he continues to develop innovative solutions in x-ray technology. His work has significantly impacted the efficiency of x-ray inspections in various applications.
Collaborations
Throughout his career, Toppan has collaborated with notable colleagues, including Jeffrey R. Schubert and Jeffrey M. Denker. These collaborations have further enhanced the development of advanced x-ray inspection technologies.
Conclusion
Jason Toppan's contributions to x-ray inspection technology demonstrate his commitment to innovation and excellence in the field. His patents reflect a deep understanding of the complexities involved in x-ray systems, paving the way for future advancements.