Jeffrey C Thon

Title: Innovations by Jeffrey C. Thon in Thickness Measurement Technology

Introduction

Jeffrey C. Thon is an accomplished inventor based in St. Louis Park, MN (US). He has made significant contributions to the field of measurement technology, particularly in the area of thickness measurement for thin plastic films. His innovative approach has led to the development of a portable gauge that enhances the accuracy and convenience of measuring material thickness.

Latest Patents

Thon holds a patent for a "Portable gauge for measuring thickness variations of thin plastic film." This capacitance gauge system is designed to determine the thickness of non-conducting materials such as polyethylene and vinyl. The system utilizes an elongated capacitance sensing head that interacts with the material being measured, allowing for precise monitoring of thickness variations. The internal circuitry of the device produces an output that is proportional to the changes in thickness, achieving remarkable sensitivity and stability.

Career Highlights

Jeffrey C. Thon is associated with Modern Controls, Inc., where he applies his expertise in developing advanced measurement solutions. His work has focused on creating devices that are not only effective but also portable, enabling users to conduct measurements quickly and conveniently. The innovative design of his gauge allows for the resolution of capacitance changes on the order of 5.times.10.sup.-17 Farads, making it a significant advancement in the field.

Collaborations

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Conclusion

Jeffrey C. Thon's contributions to measurement technology, particularly through his portable gauge for thickness measurement, exemplify the impact of innovation in practical applications. His work continues to influence the industry by providing efficient and accurate measurement solutions.