The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 1991

Filed:

Nov. 17, 1989
Applicant:
Inventor:

Jeffrey C Thon, St. Louis Park, MN (US);

Assignee:

Modern Controls, Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324671 ; 324674 ; 324687 ; 324690 ;
Abstract

A capacitance gauge system is described for determining the thickness of thin-film non-conducting material (i.e. polyethylene, vinyl, etc.). An elongated capacitance sensing head is applied to one side of the material being measured thereby disturbing the electric field produced by the head. Internal circuitry monitors the effect of the material under test and produces an output proportional to the variation in the material's thickness. A new method of resolving capacitance changes results in the ability to resolve capacitance changes on the order of 5.times.10.sup.-17 Farads in a linear manner with the benefits of simplicity, excellent stability, low power requirement, and small physical size. These factors allow said apparatus to be incorporated into a small hand-held unit. Because of this advancement in portability, accurate measurements can be made more quickly and conveniently than previously possible.


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