Jeffrey Andresen

Title: The Innovations of Jeffrey Andresen

Introduction

Jeffrey Andresen is a notable inventor based in Gilroy, CA (US). He has made significant contributions to the field of imaging technology, holding a total of 8 patents. His work focuses on enhancing the methods and systems used for macroscopic inspection of reflective specimens.

Latest Patents

One of Jeffrey's latest patents is titled "System, method and apparatus for macroscopic inspection of reflective specimens." This innovative inspection apparatus includes a specimen stage, one or more imaging devices, and a set of lights, all controllable by a control system. By translating or rotating the imaging devices or specimen stage, the apparatus can capture a first image of the specimen that includes a first imaging artifact to one side of a reference point. It can then capture a second image that includes a second imaging artifact to the opposite side of the reference point. The first and second imaging artifacts can be cropped from their respective images, allowing for the digital stitching of the two images to generate a composite image of the specimen that lacks these artifacts.

Career Highlights

Jeffrey Andresen has established himself as a key figure in the field of imaging technology. His work at Nanotronics Imaging, Inc. has been instrumental in advancing the capabilities of inspection systems. His innovative approaches have led to the development of technologies that improve the accuracy and efficiency of reflective specimen inspections.

Collaborations

Throughout his career, Jeffrey has collaborated with notable individuals such as Matthew C. Putman and John B. Putman. These collaborations have further enhanced his work and contributed to the success of the projects he has been involved in.

Conclusion

Jeffrey Andresen's contributions to the field of imaging technology are significant and impactful. His innovative patents and collaborative efforts continue to shape the future of macroscopic inspection systems.