The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
Jan. 30, 2019
Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);
Matthew C. Putman, Brooklyn, NY (US);
John B. Putman, Celebration, FL (US);
John Moffitt, Los Banos, CA (US);
Michael Moskie, San Jose, CA (US);
Jeffrey Andresen, Gilroy, CA (US);
Scott Pozzi-Loyola, Watsonville, CA (US);
Julie Orlando, Akron, OH (US);
NANOTRONICS IMAGING, INC., Cuyahoga Falls, OH (US);
Abstract
The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, a lens having a view encompassing the specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module configured to control a position of the stage, an elevation of the moveable platform, and a focus of the lens. In some implementations, the inspection apparatus includes an image processing system configured for receiving image data from the imaging device, analyzing the image data to determine a specimen classification, and automatically selecting an illumination profile based on the specimen classification. Methods and machine-readable media are also contemplated.