Jeffrey Alan Reed

Title: Jeffrey Alan Reed: Innovator in Semiconductor Technology

Introduction

Jeffrey Alan Reed is a notable inventor based in Hellertown, PA (US). He has made significant contributions to the field of semiconductor technology. His innovative work focuses on improving the reliability and performance of semiconductor devices.

Latest Patents

Reed holds a patent for a "Circuit and method for predicting failure rates in a semiconductor device." This invention addresses the detection of mobile ion contamination in semiconductor devices. The circuit employs two transistor structures on the same silicon chip as the device being tested. By imposing specific conditions on the silicon chip, the presence or absence of mobile ions can be detected. This is achieved by measuring electrical parameters, such as band gap voltage, across the transistors before and after the conditions are applied. This method provides a reliable indication of mobile ion contamination.

Career Highlights

Reed is associated with Lucent Technologies Inc., where he has contributed to various projects in semiconductor technology. His work has been instrumental in advancing the understanding of failure rates in semiconductor devices.

Collaborations

Some of his notable coworkers include William Edward Burchanowski and Ramin Khoini-Poorfard. Their collaborative efforts have further enhanced the research and development in the field.

Conclusion

Jeffrey Alan Reed's innovative contributions to semiconductor technology demonstrate his commitment to advancing the industry. His patent reflects a significant step forward in ensuring the reliability of semiconductor devices.