Avon, IN, United States of America

Jeffrey A Gilbert

USPTO Granted Patents = 2 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2017-2020

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2 patents (USPTO):Explore Patents

Title: Jeffrey A. Gilbert: Innovator in Ultrasonic Measurement Technologies

Introduction

Jeffrey A. Gilbert is a notable inventor based in Avon, IN (US), recognized for his contributions to ultrasonic measurement technologies. With a total of 2 patents, he has developed innovative techniques that enhance the understanding of crystallographic textures and defect characteristics in materials.

Latest Patents

Gilbert's latest patents include "Ultrasonic measurement and determination of crystallographic texture with respect to position" and "Detection and measurement of defect size and shape using ultrasonic Fourier-transformed waveforms." The first patent describes a technique and device that determine characteristics of a crystallographic texture based on detected ultrasonic waveforms. This device processes ultrasonic waveform data to identify dominant frequencies, which are crucial for analyzing crystallographic textures. The second patent outlines a system that analyzes ultrasonic waveforms to detect and measure defects within materials. By applying Fast Fourier Transform techniques, the system can determine the size and shape of defects, providing valuable insights into material integrity.

Career Highlights

Jeffrey A. Gilbert is currently employed at Rolls-Royce Corporation, where he applies his expertise in ultrasonic technologies to advance the company's research and development efforts. His work focuses on enhancing measurement techniques that are vital for ensuring the quality and performance of materials used in various applications.

Collaborations

Gilbert collaborates with Michael George Glavicic, contributing to the development of innovative solutions in the field of ultrasonic measurement.

Conclusion

Jeffrey A. Gilbert's work in ultrasonic measurement technologies exemplifies the impact of innovation on material science. His patents reflect a commitment to advancing techniques that improve our understanding of material properties and defect characterization.

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