The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Feb. 17, 2012
Michael G. Glavicic, Indianapolis, IN (US);
Jason A. Gilbert, Ione, CA (US);
Michael G. Glavicic, Indianapolis, IN (US);
Jeffrey A. Gilbert, Avon, IN (US);
Rolls-Royce Corporation, Indianapolis, IN (US);
Abstract
A system may include a data analysis device that is configured to receive from an ultrasonic waveform detector ultrasonic waveform data representative of an ultrasonic waveform that propagated through a sample and resonated within a defect within the sample. The data analysis device may be further configured to select a portion of the ultrasonic waveform data, apply a Fast Fourier Transform to the portion of the ultrasonic waveform data to transform the portion from a time domain to a frequency domain, identify a characteristic frequency of the portion in the frequency domain, and determine a characteristic of the defect based on the characteristic frequency of the portion. In some examples, the characteristic of the defect may be at least one of an approximate size or an approximate shape of the defect.