Aurora, IL, United States of America

Jeffery P Chamberlain

This inventor holds 2 USPTO granted patents. Top assignee: Cabot Microelectronics Corporation. Active years: 2007-2008.


% Patents Active = 50.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2007-2008

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2 patents (USPTO):Explore Patents

Title: Jeffery P Chamberlain: Innovator in Silicon Oxide Removal Technologies

Introduction

Jeffery P Chamberlain is a notable inventor based in Aurora, IL (US). He has made significant contributions to the field of materials science, particularly in the area of silicon oxide removal technologies. With a total of 2 patents to his name, Chamberlain continues to push the boundaries of innovation.

Latest Patents

Chamberlain's latest patents focus on a system for the preferential removal of silicon oxide. This invention includes a polishing composition that comprises about 0.5 wt. % or more of fluoride ions, about 1 wt. % or more of an amine, about 0.1 wt. % or more of a base, and water, along with an abrasive. The method provided allows for effective planarizing or polishing of composite substrates, showcasing his expertise in developing advanced materials processing techniques.

Career Highlights

Chamberlain is currently employed at Cabot Microelectronics Corporation, where he applies his innovative ideas to real-world applications. His work has been instrumental in enhancing the efficiency and effectiveness of semiconductor manufacturing processes.

Collaborations

Throughout his career, Chamberlain has collaborated with talented individuals such as Brian L Mueller and David Schroeder. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Jeffery P Chamberlain stands out as a key figure in the field of silicon oxide removal technologies. His innovative patents and collaborative efforts continue to influence advancements in materials science.

Profile summary based on public USPTO records.
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