Company Filing History:
Years Active: 2018
Title: Jeffery Allan Shepler: Innovator in Wafer-Level Testing Technologies
Introduction
Jeffery Allan Shepler is a notable inventor based in Vadnais Heights, MN (US). He has made significant contributions to the field of wafer-level testing technologies. His innovative work has led to the development of a patent that addresses critical challenges in testing devices under varying temperature conditions.
Latest Patents
Shepler holds a patent titled "Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges." This patent discloses methods designed to test a plurality of devices under test (DUTs) present on a substrate. The probe systems are programmed to perform these methods, while the storage media includes computer-readable instructions that guide the probe system in executing the testing processes.
Career Highlights
Throughout his career, Jeffery Allan Shepler has worked with prominent companies in the industry, including FormFactor Beaverton, Inc. and FormFactor, Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in testing technologies.
Collaborations
Shepler has collaborated with talented individuals in his field, including Timothy Allen McMullen and Clint Vander Giessen. These partnerships have fostered innovation and have been instrumental in the development of new technologies.
Conclusion
Jeffery Allan Shepler's contributions to wafer-level testing technologies exemplify his dedication to innovation. His patent and career achievements highlight his role as a significant figure in the field.