Jeff Wagner

Title: Jeff Wagner: Innovator in Aerosol Sampling Technology

Introduction

Jeff Wagner is an accomplished inventor based in Oakland, CA (US). He has made significant contributions to the field of aerosol sampling technology. His innovative work has led to the development of a unique passive aerosol sampler that enhances the analysis of airborne particles.

Latest Patents

Wagner holds a patent for a "Passive aerosol sampler and methods." This miniature, passive aerosol particle sampler features a scanning electron microscopy mount equipped with a collection surface and a removable mesh cover. The design includes a spacer ring and a mesh sheet, which facilitate effective sampling. The associated sampling and analysis method employs scanning electron microscopy and image analysis to determine a particle-count size distribution. Additionally, a deposition velocity model, comprising both theoretical and empirical components, is utilized to ascertain the average airborne mass concentration of aerosol particles to which the sampler was exposed. He has 1 patent to his name.

Career Highlights

Wagner is affiliated with the University of North Carolina at Chapel Hill, where he continues to advance research in aerosol science. His work has garnered attention for its practical applications in environmental monitoring and public health.

Collaborations

Wagner collaborates with David Leith, a fellow researcher, to further explore the implications of aerosol sampling in various contexts.

Conclusion

Jeff Wagner's innovative contributions to aerosol sampling technology exemplify the impact of dedicated research and development in environmental science. His work not only enhances our understanding of airborne particles but also paves the way for future advancements in the field.