The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2001
Filed:
Apr. 07, 2000
Applicant:
Inventors:
Jeff Wagner, Oakland, CA (US);
David Leith, Chapel Hill, NC (US);
Assignee:
The University of North Carolina - Chapel Hill, Chapel Hill, NC (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 ;
U.S. Cl.
CPC ...
G01N 1/00 ;
Abstract
A miniature, passive aerosol particle sampler comprises a scanning electron microscopy mount provided with a collection surface and a removable mesh cover comprising a spacer ring and a mesh sheet. A sampling and analysis method comprises scanning electron microscopy and image analysis to determine a particle-count size distribution. A deposition velocity model comprising a theoretical component and an empirical component is used to determine from the particle-count size distribution the average airborne mass concentration of aerosol particles to which the sampler was exposed.