This inventor holds 2 USPTO granted patents. Top assignee: Kla Tencor Corporation. Active years: 2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2011
Title: Jeff T Fanton: Innovator in Ellipsometry
Introduction
Jeff T Fanton is a notable inventor based in Los Altos, California. He has made significant contributions to the field of ellipsometry, particularly through his innovative patents. With a total of 2 patents, Fanton has focused on enhancing the capabilities of ellipsometric technology.
Latest Patents
Fanton's latest patents include the "Complementary waveplate rotating compensator ellipsometer" and the "Normal incidence ellipsometer with complementary waveplate rotating compensators." The first patent discloses a method of using two waveplates of complementary retardation in a dual rotating compensator configuration. This innovation increases the useful spectral range of a rotating compensator ellipsometer, especially towards the deep Ultraviolet (UV) spectrum. The improved design allows users to select specific waveplate retardations, thereby extending the operating wavelength range.
The second patent introduces a different waveplate into a single rotating compensator normal incidence ellipsometer. This waveplate provides a quarter wavelength retardation that complements the first waveplate. This design enhances the spectral range for useful retardation, particularly in the deep UV spectrum. The system's sensitivity is also improved, allowing for optimized performance across different spectral ranges.
Career Highlights
Jeff T Fanton is currently associated with KLA-Tencor Corporation, where he continues to work on advancing ellipsometric technologies. His expertise in the field has positioned him as a key contributor to the company's innovative projects.
Collaborations
Fanton collaborates with Klaus Flock, a fellow innovator in the field. Their combined efforts contribute to the development of cutting-edge technologies in ellipsometry.
Conclusion
Jeff T Fanton is a distinguished inventor whose work in ellipsometry has led to significant advancements in the field. His innovative patents reflect his commitment to enhancing the capabilities of optical measurement technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile