Company Filing History:
Years Active: 2019-2021
Title: Jeff Andresen: Innovator in Wafer and Photomask Inspection Technologies
Introduction
Jeff Andresen is a notable inventor based in Gilroy, CA (US). He has made significant contributions to the field of wafer and photomask inspection technologies. With a total of 2 patents to his name, his work has advanced the capabilities of inspection systems in the semiconductor industry.
Latest Patents
Jeff's latest patents focus on systems, devices, and methods for combined wafer and photomask inspection. These innovations include chucks that feature a removable insert designed to support a wafer, ensuring that its examination surface lies within a focal range in a specific configuration. Additionally, the chucks are equipped with a structure that forms a recess deep enough to support a photomask, allowing for precise examination in another configuration.
Career Highlights
Jeff Andresen is currently employed at Nanotronics Imaging, Inc., where he continues to develop cutting-edge technologies. His expertise in the field has positioned him as a key player in advancing inspection methodologies.
Collaborations
Some of Jeff's coworkers include Randolph E Griffith and Scott Pozzi-Loyola, who contribute to the innovative environment at Nanotronics Imaging, Inc.
Conclusion
Jeff Andresen's work in wafer and photomask inspection technologies exemplifies the spirit of innovation in the semiconductor industry. His patents reflect a commitment to enhancing inspection systems, making significant strides in the field.