Paris, France

Jean-Yves Petit

This inventor holds 1 USPTO granted patent. Top assignee: Roquette Freres. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Yves Petit. Retrieved from https://idiyas.com/inventor/jean-yves-petit

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Inventor Jean-Yves Petit: Innovating Paper Manufacturing in Paris

Introduction

Jean-Yves Petit is an esteemed inventor based in Paris, France, known for his contribution to the paper manufacturing industry. With a focus on innovative processes, his work has paved the way for advancements in this essential field.

Latest Patents

Jean-Yves holds one patent specifically for a "Process for the Manufacture of Paper." This invention showcases his expertise in enhancing the efficiency and quality of paper production, an area critical for various applications across industries.

Career Highlights

Currently employed at Roquette Frères, Jean-Yves Petit has made significant strides in the industry. His commitment to innovation and improvement in manufacturing processes has positioned him as a notable figure in his professional environment.

Collaborations

In his journey as an inventor, Jean-Yves collaborates with fellow innovator Marcel Dondeyne. Together, they share insights and expertise, contributing to the advancement of their field and fostering a collaborative spirit within their team.

Conclusion

Jean-Yves Petit's contributions to the paper manufacturing process exemplify the spirit of innovation in Paris. As he continues to work at Roquette Frères, his endeavors will likely inspire more advancements in the industry, proving that creativity and technical know-how can yield significant impacts.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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