This inventor holds 1 USPTO granted patent. Top assignee: Centre De Recherche Industrielle Du Quebec. Active years: 2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2005
Title: Innovations of Jean T Bédard
Introduction
Jean T Bédard is a notable inventor based in Charlesbourg, Canada. He has made significant contributions to the field of particle quantification through his innovative inventions. His work focuses on developing advanced apparatuses that enhance the efficiency of particle collection and analysis.
Latest Patents
Jean T Bédard holds a patent for a "Particle quantifying apparatus and method." This invention involves an apparatus designed to estimate the quantity of particles collected by a suction extractor. The apparatus features a capturing element handling assembly with stationary plates that define a gap for particle flow. A movable disk within this gap is equipped with holders for filter-type particle capturing elements. The system includes an optical sensing device that inspects the captured particles and a data processor that analyzes the measurement signals to estimate the quantity of particles. This innovative design allows for controlled movement and cleaning of the capturing elements, enhancing the overall efficiency of the particle quantification process.
Career Highlights
Jean T Bédard is associated with the Centre de Recherche Industrielle du Québec, where he has contributed to various research projects and innovations. His work has been instrumental in advancing technologies related to particle analysis and collection.
Collaborations
Throughout his career, Jean T Bédard has collaborated with notable colleagues, including Pierre Bédard and Jean-Guy Boucher. These collaborations have fostered a productive environment for innovation and research.
Conclusion
Jean T Bédard's contributions to the field of particle quantification demonstrate his commitment to innovation and research. His patented apparatus reflects a significant advancement in the technology used for particle analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
