The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Jan. 28, 2003
Pierre Bédard, Charlesbourg, CA;
Jean-pierre Couturier, Sainte-Foy, CA;
Jean-guy Boucher, St. Étienne, CA;
Jean T. Bédard, Charlesbourg, CA;
Pierre Bédard, Charlesbourg, CA;
Jean-Pierre Couturier, Sainte-Foy, CA;
Jean-Guy Boucher, St. Étienne, CA;
Jean T. Bédard, Charlesbourg, CA;
Centre de Recherche Industrielle du Québec, Montréal, CA;
Abstract
An apparatus for estimating the quantity of particles collected by a suction extractor includes a capturing element handling assembly including a pair of stationary plates disposed in a spaced relationship to define a gap therebetween, the stationary elements being provided with sets of main apertures disposed in alignment with each other to define a corresponding set of channels extending through the gap. A movable disk interposed within the gap is provided with a plurality of holders capable of receiving a plurality of filter-type particle capturing elements. An actuator operatively coupled to the movable disk provides controlled movement thereof relative to the stationary plates. One of the main apertures on the first stationary plate defines a first inlet in fluid communication with an output fluid carrying line, while one aligned aperture on the second stationary plate defines a first outlet for fluid communication with the output fluid carrying line. The apparatus further includes an optical sensing device disposed in alignment with a secondary aperture provided on the first stationary element and extending therethrough to communicate with the gap, for inspecting a selected particle capturing element to generate a measurement signal representative of optical characteristics of the captured particles, and a data processor for analyzing the measurement signal to generate an estimation of the quantity of particles captured by the selected element. A controller is operatively connected to the actuator to selectively displace the movable disk from a capturing position to an inspection position in respect of a selected particle capturing element. There is provided a device for cleaning a previously inspected capturing element while the selected capturing element is in the capturing position.