Marseille, France

Jean-Luc Mari

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Luc Mari. Retrieved from https://idiyas.com/inventor/jean-luc-mari-y6w1s047

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,659 
Other
 patents

Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations by Jean-Luc Mari

Introduction

Jean-Luc Mari is an accomplished inventor based in Marseilles, France. He has made significant contributions to the field of manufacturing through his innovative methods. His work focuses on improving the inspection processes of workpieces during manufacturing operations.

Latest Patents

Jean-Luc Mari holds a patent for a "Method for inspecting a workpiece in the process of being manufactured." This invention relates to a method for inspecting a part mounted in a manufacturing fixture between two manufacturing operations. His innovative approach enhances the efficiency and accuracy of manufacturing processes.

Career Highlights

Throughout his career, Jean-Luc Mari has demonstrated a commitment to advancing manufacturing technologies. His patent showcases his ability to identify challenges in the manufacturing process and develop effective solutions. With 1 patent to his name, he has established himself as a notable figure in his field.

Collaborations

Jean-Luc has worked alongside talented individuals such as Dominique Nozais and Manon Peuzin Jubert. Their collaborative efforts have contributed to the development of innovative solutions in manufacturing.

Conclusion

Jean-Luc Mari's contributions to the field of manufacturing through his innovative patent reflect his dedication to improving industrial processes. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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