The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2024
Filed:
May. 19, 2021
Applicant:
I-mc, Pertuis, FR;
Inventors:
Dominique Nozais, Pertuis, FR;
Manon Peuzin Jubert, Aix en Provence, FR;
Jean-Luc Mari, Marseilles, FR;
Jean-Philippe Pernot, Aix en Provence, FR;
Arnaud Polette, Aix en Provence, FR;
Assignee:
I-MC, Pertuis, FR;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/00 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/005 (2013.01); G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20072 (2013.01); G06T 2207/30164 (2013.01);
Abstract
The invention relates to a method for inspecting a part mounted in a manufacturing fixture between two manufacturing operations by means comprising:
Quick Actions:
Nozais, Dominique. (2024). Method for inspecting a workpiece in the process of being manufactured (U.S. Patent No. 11920917). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11920917
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile