Jean-François Boulanger

Title: Innovations of Jean-François Boulanger

Introduction

Jean-François Boulanger is a notable inventor based in Saint-Ismier, France. He has made significant contributions to the field of measurement systems and inspection methods, holding a total of four patents. His work focuses on enhancing the detection of defects in bonding interfaces and improving measurement techniques using advanced optical methods.

Latest Patents

One of his latest patents is an inspection method for detecting a defective bonding interface in a sample substrate. This method involves placing the sample substrate in a measurement system, establishing an inclination map of the exposed surface, and analyzing this map to identify zones with inclinations that deviate from a reference surface. The analysis helps in detecting the presence of defective bonds between elements and their supports.

Another significant patent is a method and system for measuring a surface of an object that comprises different structures using low coherence interferometry. This method utilizes an interferometric device, a light source, an imaging sensor, and a processing module. The process includes acquiring interferometric signals, classifying them using a learning technique, and analyzing these signals to derive information about the structure at various measurement points.

Career Highlights

Jean-François Boulanger has worked with prominent companies such as Unity Semiconductor Corporation and Commissariat à l'énergie atomique et aux alternatives. His experience in these organizations has contributed to his expertise in developing innovative measurement systems and inspection methods.

Collaborations

Some of his notable coworkers include Isabelle Bergoënd and Dario Alliata. Their collaboration has likely fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Jean-François Boulanger's contributions to the field of measurement and inspection methods highlight his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving the accuracy and reliability of defect detection in various applications.