Eybens, France

Jean-Francois Veneau

This inventor holds 1 USPTO granted patent. Top assignee: Memscap. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Francois Veneau. Retrieved from https://idiyas.com/inventor/jean-francois-veneau

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jean-Francois Veneau

Introduction

Jean-Francois Veneau is a notable inventor based in Eybens, France. He has made significant contributions to the field of accelerometry, particularly through his innovative designs and methods. His work has led to the development of a unique pendulous accelerometer, showcasing his expertise and creativity in engineering.

Latest Patents

Jean-Francois Veneau holds a patent for a "Method for manufacturing a pendulous accelerometer." This invention relates to a pendulous accelerometer that includes a pendulous electrode formed in a substrate, at least one counter electrode, and an encapsulation cover. The design features spacers positioned between the cover and the substrate, enhancing the functionality and accuracy of the accelerometer.

Career Highlights

Veneau is currently associated with Memscap, a company known for its advancements in micro-electromechanical systems (MEMS). His role at Memscap has allowed him to further develop his ideas and contribute to cutting-edge technologies in the field.

Collaborations

Some of his notable coworkers include Béatrice Wenk and Greg Hames, who have collaborated with him on various projects, enhancing the innovative environment at Memscap.

Conclusion

Jean-Francois Veneau's contributions to the field of accelerometry through his patent and work at Memscap highlight his role as a significant inventor. His innovative methods continue to influence the development of advanced technologies in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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