Jay Kothari

Title: Jay Kothari: Innovator in Wafer Testing Technology

Introduction

Jay Kothari is a notable inventor based in San Diego, California. He has made significant contributions to the field of integrated circuit fabrication, particularly in wafer testing technology. His innovative approach addresses critical challenges in the industry, showcasing his expertise and dedication to advancing technology.

Latest Patents

Kothari holds a patent for "PCM metal shielding for wafer testing." This invention presents methods and devices designed to reduce yield loss during the integrated circuit fabrication process. The patent specifically addresses undesired interactions between PCMs and wafer test probes during wafer sorting tests. The methods involve using a properly patterned metal layer on the PCM dies adjacent to the product dies under test. These patterned metal layers effectively shield the traces of the wafer probes from the circuits of the PCM dies. Various exemplary metal layer patterns are also included in the patent.

Career Highlights

Jay Kothari is currently employed at Psemi Corporation, where he continues to innovate and contribute to the field. His work at Psemi Corporation has allowed him to collaborate with other talented professionals in the industry.

Collaborations

Some of his notable coworkers include Jacob Hamilton and Tran Kononova. Their collective efforts contribute to the advancement of technology in wafer testing and integrated circuit fabrication.

Conclusion

Jay Kothari's contributions to wafer testing technology through his innovative patent demonstrate his commitment to improving integrated circuit fabrication processes. His work at Psemi Corporation and collaborations with talented colleagues further enhance his impact in the field.