Valencia, Spain

Javier Antich Romaguera

This inventor holds 1 USPTO granted patent. Top assignee: Selector Software, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Javier Antich Romaguera. Retrieved from https://idiyas.com/inventor/javier-antich-romaguera

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Javier Antich Romaguera and Optical Transceiver Reliability

Introduction

Javier Antich Romaguera is an inventor based in Valencia, Spain. His patent work addresses the early identification of optical transceiver failures, helping detect potential hardware problems through analysis of device metrics.

Latest Patents

Romaguera is associated with 1 patent: “Early Identification of Optical Transceiver Failures.” The invention describes systems, apparatuses, and methods for identifying sustained, significant changes in transceiver metrics that may predict failure. It tracks percentage changes in metrics over configurable periods and flags anomalies when changes persist for a minimum duration. It also correlates metrics with transceiver metadata and compares devices of the same vendor, type, and model to detect outliers. A variability factor is considered as a possible indicator of hardware conditions that could precede failure.

Career Highlights

Romaguera is associated with Selector Software, Inc. His patent reflects work on using metric monitoring and outlier detection to identify possible transceiver failures before they occur.

Collaborations

Aditya Vanam and Debashis Mohanty are identified as some of Romaguera’s coworkers. The available information does not specify their roles in the patent.

Conclusion

Javier Antich Romaguera’s patent focuses on detecting early warning signs of optical transceiver failure by analyzing persistent metric changes, device metadata, and outliers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…