The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Dec. 07, 2023
Applicant:

Selector Software, Inc., Santa Clara, CA (US);

Inventors:

Aditya Vanam, Bangalore, IN;

Javier Antich Romaguera, Valencia, ES;

Debashis Mohanty, San Jose, CA (US);

Assignee:

Selector Software, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/17 (2015.01); H04B 17/373 (2015.01);
U.S. Cl.
CPC ...
H04B 17/17 (2015.01); H04B 17/373 (2015.01);
Abstract

Systems, apparatuses, and methods are disclosed to identify sustained and significant changes in transceiver metrics for predicting transceiver failure. A percentage of change with respect to a previous value in the metric can be tracked over a configurable period of time. Anomalies can be identified if such change persists over a minimum configurable period of time. The metrics as well as transceiver metadata are correlated to perform an outlier detection. Optical transceivers of the same type (characterized by a combination of vendor, type, and model) are analyzed for outlier detection. A variability factor is taken into account for metrics, as an indicator of a likely hardware condition that may be precursor of a failure.


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