Jau-Hu Lee

Title: Jau-Hu Lee: Innovator in Precision Measurement Technology

Introduction

Jau-Hu Lee is a distinguished inventor based in Taipei, Taiwan. He has made significant contributions to the field of precision measurement technology, particularly in the area of flying height measurement.

Latest Patents

Jau-Hu Lee holds a patent for a "Method and an apparatus for measuring the flying height with sub-nanometer resolution." This innovative method and apparatus are designed to measure the distance between a slider and a transparent disk with remarkable precision. The flying height is determined by applying ellipsometry, which involves providing a sampling light beam with an adjustable initial polarization state through phase modulation. The measurement process includes variable incident angles relative to the air film and reflecting the sampling light off the specimen at a detection site. This results in a reflected light beam that is further processed to detect intensity and phase changes, allowing for accurate determination of the gap's thickness.

Career Highlights

Jau-Hu Lee is affiliated with the National Science Council, where he continues to advance research and development in measurement technologies. His work has garnered attention for its innovative approach and practical applications in various scientific fields.

Collaborations

Throughout his career, Jau-Hu Lee has collaborated with notable colleagues, including Chih-Kung Lee and Shuen-Chen Shiue. These collaborations have contributed to the advancement of research and innovation in their respective fields.

Conclusion

Jau-Hu Lee's contributions to precision measurement technology exemplify the impact of innovative thinking in scientific research. His patent and ongoing work at the National Science Council highlight his commitment to advancing technology and improving measurement techniques.