Wappingers Falls, NY, United States of America

Jassie Yu

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jassie Yu. Retrieved from https://idiyas.com/inventor/jassie-yu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Jassie Yu: Innovator in Automatic Regression Testing

Introduction

Jassie Yu is an accomplished inventor based in Wappingers Falls, NY (US). He has made significant contributions to the field of software testing through his innovative patent. His work focuses on enhancing the efficiency and accuracy of regression testing processes.

Latest Patents

Jassie Yu holds a patent for a "Method of Automatic Regression Testing." This method involves loading binary code representing a first version of a program and extracting a second version embedded within that binary code. The process includes executing a standalone model of the second version to identify errors and determining if the model causes those errors. The results of this analysis are then stored for further review.

Career Highlights

Jassie Yu is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to work on cutting-edge technologies and contribute to advancements in software development and testing.

Collaborations

Throughout his career, Jassie has collaborated with notable colleagues, including Eli M Dow and Marie R Laser. These collaborations have fostered a creative environment that encourages innovation and problem-solving.

Conclusion

Jassie Yu's contributions to automatic regression testing exemplify his commitment to improving software quality. His innovative methods and collaboration with talented professionals continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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