The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8132157 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 06, 2012

Filed:

Jan. 17, 2008
Applicants:

Charulatha Dhuvur, Poughkeepsie, NY (US);

Eli M. Dow, Poughkeepsie, NY (US);

Marie R. Laser, Poughkeepsie, NY (US);

Jassie Yu, Wappingers Falls, NY (US);

Inventors:

Charulatha Dhuvur, Poughkeepsie, NY (US);

Eli M. Dow, Poughkeepsie, NY (US);

Marie R. Laser, Poughkeepsie, NY (US);

Jassie Yu, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of automatic regression testing includes loading binary code representing a first version of a program, extracting a second version of the program embedded within the binary code of the first version of the program, executing a standalone model of the second version of the program based on the extracted second version, wherein executing includes executing a set of instructions to identify at least one error, determining if the standalone model causes the at least one error, and storing results based on the determining.


Find Patent Forward Citations

Dhuvur, Charulatha. (2012). Method of automatic regression testing (U.S. Patent No. 8132157). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8132157

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