Ijamsville, MD, United States of America

Jason T Dowling


Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Jason T Dowling: Innovator in Integrated Circuit Design

Introduction

Jason T Dowling is a notable inventor based in Ijamsville, Maryland. He has made significant contributions to the field of integrated circuit design, particularly in enhancing the resilience of these circuits against environmental factors. His innovative approach has led to the development of a unique method that addresses critical challenges in the industry.

Latest Patents

Jason holds a patent for a "Method for radiation hardening of integrated circuits." This invention is an IC design enhancing tool that automatically reviews and environmentally hardens an integrated circuit design layout. The tool is realized in software that scans through an IC netlist generated by an electronic design automation (EDA) tool. It replaces components that do not comply with predetermined hardening criteria. The iterative process between the EDA tool and the IC design enhancing tool ensures that the final design layout is fully compliant for a given environment.

Career Highlights

Jason is currently employed at Bae Systems Information and Electronic Systems Integration Inc. His work focuses on advancing technologies that improve the reliability and performance of integrated circuits. His expertise in this area has positioned him as a valuable asset to his organization.

Collaborations

Jason has collaborated with notable colleagues, including Brian A Saari and Stephen A Chadwick. These partnerships have fostered an environment of innovation and have contributed to the successful development of advanced technologies in integrated circuit design.

Conclusion

Jason T Dowling's contributions to the field of integrated circuit design exemplify the impact of innovative thinking in technology. His patent for radiation hardening methods showcases his commitment to enhancing the reliability of electronic systems.

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