This inventor holds 1 USPTO granted patent. Top assignee: Oplink Communications, Inc.. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Innovations by Jason Li: A Pioneer in Leak Detection Technology.
Introduction
Jason Li is an accomplished inventor based in Union City, CA (US). He has made significant contributions to the field of optical devices through his innovative patent. His work focuses on enhancing the reliability and performance of sealed optical devices.
Latest Patents
Jason Li holds a patent for a "Leak detector for sealed optical devices." This invention discloses a method for detecting leaks from sealed optical devices. The method includes several steps: A) injecting a target gas that does not interfere with the performance of the sealed optical device for leak detection, followed by sealing the device. B) Placing the sealed device in a leak testing chamber and measuring the background level of the target gas in that chamber. C) Heating the sealed device to a gas-expelling temperature to expel the target gas from any leaks present. D) Detecting the target gas in a one-part-per-million (PPM) range in the leak-detecting chamber and comparing it with the background level to determine the presence of a leak.
Career Highlights
Jason Li is currently employed at Oplink Communications, Inc., where he applies his expertise in optical technology. His innovative approach to leak detection has positioned him as a valuable asset in his field.
Collaborations
Jason collaborates with Steven Guoxin Zhu, who is also a key figure in their projects at Oplink Communications, Inc. Their teamwork enhances the development of cutting-edge technologies in optical devices.
Conclusion
Jason Li's contributions to leak detection technology exemplify his commitment to innovation in the field of optical devices. His patent not only showcases his inventive spirit but also addresses critical challenges in ensuring the integrity of sealed optical devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
