The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2004

Filed:

Mar. 05, 2001
Applicant:
Inventors:

Jason Li, Union City, CA (US);

Steven Guoxin Zhu, Fremont, CA (US);

Assignee:

Oplink Communications, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/100 ;
U.S. Cl.
CPC ...
G01N 3/100 ;
Abstract

This invention discloses a method for detecting a leak from a sealed optical device. The method includes steps of: A) injecting a target gas with no performance interference to the sealed optical device for leak detection followed by sealing the sealed optical device. B) placing the sealed device in a leak testing chamber and measuring a background level of the target gas in the leak testing chamber. C) heating the sealed device to a gas-expelling temperature for expelling the target gas from the leak in the sealed optical device. And, D) detecting the target gas in a one-part-per million (PPM) range in the leak-detecting chamber for an comparing with the background level of the target gas for determining the leak in the sealed optical device.


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