Incheon, South Korea

Jang Won Shin

This inventor holds 1 USPTO granted patent. Top assignees: Akc Co., Ltd., Joongwoo M-Tech Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jang Won Shin. Retrieved from https://idiyas.com/inventor/jang-won-shin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Jang Won Shin: Innovator in Light Reflection Technology

Introduction

Jang Won Shin is a notable inventor based in Incheon, South Korea. He has made significant contributions to the field of optical inspection technology, particularly through his innovative patent related to light reflection support systems.

Latest Patents

Jang Won Shin holds a patent for a "Light reflection support and through hole inspection system." This invention provides a solution for stably fixing and supporting a glass substrate while reflecting illumination light to enhance inspection precision. The system is designed to improve the clarity of images captured from through holes in substrates, ensuring that the inspection process is both efficient and accurate. The light reflection support includes a transparent support part with a suction hole, which allows for effective imaging of the inspection target.

Career Highlights

Throughout his career, Jang has worked with several companies, including Joongwoo M-Tech Co., Ltd. and AKC Co., Ltd. His experience in these organizations has contributed to his expertise in developing advanced inspection technologies.

Collaborations

Jang has collaborated with notable colleagues such as Sung Soo Park and Hyun Jin Tak. Their combined efforts have likely fostered innovation and advancements in their respective fields.

Conclusion

Jang Won Shin's contributions to light reflection technology and optical inspection systems highlight his role as an influential inventor. His patent demonstrates a commitment to enhancing precision in imaging and inspection processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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