The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Aug. 26, 2024
Joongwoo M-tech Co., Ltd., Ansan-si, KR;
Akc Co., Ltd., Hwaseong-si, KR;
Sung Soo Park, Yongin-si, KR;
Hyun Jin Tak, Sejong-si, KR;
Dong Kook Bae, Hwaseong-si, KR;
Hyeon Gu Kim, Hwaseong-si, KR;
Jang Won Shin, Incheon, KR;
Jin Hwan Bae, Osan-si, KR;
JOONGWOO M-TECH CO., LTD., Ansan-si, KR;
AKC CO., LTD., Hwaseong-si, KR;
Abstract
An embodiment provides a light reflection support and a through hole inspection system including the same, wherein the light reflection support stably fixes and supports a glass substrate, an inspection target, and reflects illumination light to a lower part of a glass substrate arranged on the opposite side of an imaging part to increase inspection precision from a clear imaged image of a through hole. The light reflection support is used in a device that images a through hole formed in a substrate and inspects whether the through hole is normal from the imaged image, and includes a transparent support part and a reflection layer part. The transparent support part supports the substrate and has a suction hole that extends to a solid area of the substrate where the through hole is not formed.