Hwaseong, South Korea

Dong Kook Bae

This inventor holds 1 USPTO granted patent. Top assignees: Akc Co., Ltd., Joongwoo M-Tech Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dong Kook Bae. Retrieved from https://idiyas.com/inventor/dong-kook-bae

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Dong Kook Bae

Introduction

Dong Kook Bae is a notable inventor based in Hwaseong-si, South Korea. He has made significant contributions to the field of technology, particularly in the area of inspection systems. His work focuses on enhancing the precision of imaging through innovative designs.

Latest Patents

Dong Kook Bae holds a patent for a "Light reflection support and through hole inspection system." This invention provides a light reflection support that stably fixes and supports a glass substrate, which serves as an inspection target. The system reflects illumination light to improve inspection precision by providing a clear image of a through hole. The design includes a transparent support part with a suction hole that extends to a solid area of the substrate, ensuring effective inspection of the through hole.

Career Highlights

Throughout his career, Dong Kook Bae has worked with various companies, including Joongwoo M-Tech Co., Ltd. and AKC Co., Ltd. His experience in these organizations has contributed to his expertise in developing innovative inspection technologies.

Collaborations

Dong Kook Bae has collaborated with notable colleagues such as Sung Soo Park and Hyun Jin Tak. These partnerships have fostered a creative environment that has led to advancements in their respective fields.

Conclusion

Dong Kook Bae's contributions to the field of technology, particularly through his patent for a light reflection support and inspection system, highlight his innovative spirit and dedication to improving inspection precision. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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