Jang Sup Yoon is a notable inventor based in Gainesville, FL (US). He has made significant contributions to the field of embedded measurement systems, holding a total of 3 patents. His work focuses on enhancing the accuracy and efficiency of high-frequency multi-port devices.

Latest Patents

One of Jang Sup Yoon's latest patents is a "System, device, and method for embedded S-parameter measurement." This innovative system includes an s-parameter test circuit designed to connect to a port of a high-frequency multi-port device-under-test (DUT). The circuit features a directional coupler that samples both forward and reverse signals, along with a peak detector and a phase detector to analyze the signal's magnitude and phase. Another significant patent is for a "Power detector of embedded IC test circuits." This self-testing transceiver incorporates on-chip power detection capabilities, including a high-power amplifier and a receiver for antenna coupling. The design also features a power detector for measuring RMS and peak power signals.

Career Highlights

Jang Sup Yoon is affiliated with the University of Florida Research Foundation Inc., where he continues to advance research in embedded systems. His innovative work has positioned him as a key figure in the development of measurement technologies.

Collaborations

He has collaborated with esteemed colleagues such as William Richard Eisenstadt and Robert M. Fox, contributing to the advancement of their shared research interests.

Conclusion

Jang Sup Yoon's contributions to embedded measurement systems reflect his dedication to innovation and technology. His patents demonstrate a commitment to improving the functionality of high-frequency devices, making a lasting impact in his field.