Jang Soo Choi

Title: Jang Soo Choi: Innovator in Substrate Measurement Technology

Introduction

Jang Soo Choi is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of substrate measurement technology. His innovative approach has led to the development of a unique on-line measuring system that enhances the accuracy of substrate thickness measurement.

Latest Patents

Jang Soo Choi holds a patent for an "On-line measuring system for measuring substrate thickness and the method thereof." This system includes a first image detector, a second image detector, an elevator, and a display device. The first image detector indicates vertical variations of the bottom surface of the substrate, while the second image detector captures an image of the bottom surface. The elevator adjusts the position of the second image detector to maintain a constant vertical distance from the bottom surface, allowing for precise thickness calculations.

Career Highlights

Jang Soo Choi is currently employed at Samsung Corning Co., Ltd., where he continues to innovate and develop new technologies. His work has been instrumental in advancing the capabilities of substrate measurement systems.

Collaborations

Some of his coworkers include Jong Eun Ha and Taek Cheon Kim, who contribute to the collaborative environment at Samsung Corning Co., Ltd. Their teamwork fosters innovation and drives the development of cutting-edge technologies.

Conclusion

Jang Soo Choi's contributions to substrate measurement technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to precision and advancement in the field.