Uster, Switzerland

Jürg Zehr

This inventor holds 1 USPTO granted patent. Top assignee: Zellweger Luwa Ag. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jürg Zehr. Retrieved from https://idiyas.com/inventor/janduumlrg-zehr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2002

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jürg Zehr: Innovator in Textile Measurement Technology

Introduction

Jürg Zehr is a notable inventor based in Uster, Switzerland. He has made significant contributions to the field of textile measurement technology. His innovative approach has led to the development of a unique device that enhances the accuracy and efficiency of measuring properties of textile products.

Latest Patents

Jürg Zehr holds a patent for a "Device for measuring properties of a textile product." This invention relates to a device designed to measure the properties of a textile test specimen within a measuring gap. The measuring gap is formed by two walls, and the device includes a guide element that simplifies the adjustment process while ensuring the test specimen is accurately guided.

Career Highlights

Throughout his career, Jürg Zehr has been associated with Zellweger Luwa AG, a company known for its advancements in textile technology. His work has focused on improving measurement techniques, which are crucial for quality control in textile manufacturing.

Collaborations

Jürg has collaborated with talented individuals such as Diego Madone and Walter Isotton. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Jürg Zehr's innovative contributions to textile measurement technology exemplify the importance of precision in the industry. His patent and collaborative efforts continue to influence advancements in textile testing methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…