The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

Mar. 15, 1999
Applicant:
Inventors:

Jürg Zehr, Uster, CH;

Diego Madone, Uster, CH;

Walter Isotton, Uster, CH;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 0/504 ;
U.S. Cl.
CPC ...
G01L 0/504 ;
Abstract

The invention relates to a device for measuring properties of a textile test specimen in a measuring gap ( ), in which the textile test specimen is introduced, the measuring gap being formed by two walls. In order to provide a device of the type described, with which adjustment of the guide is simplified and with which the test specimen is nevertheless guided with sufficient accuracy, there is provided in the measuring gap a guide element ( ) for the test specimen, which is associated with a wall and adjusted in a stationary manner relative to said wall.


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