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For the Inventor, By the Inventor

Londerzeel, Belgium

Jan Verspecht

USPTO Granted Patents = 23 

Average Co-Inventor Count = 1.6

ph-index = 6

Forward Citations = 141(Granted Patents)


Location History:

  • Steenhufffel, BE (2005)
  • Londerzeel, Vlaams-Brabant, BE (2007)
  • Steenhuffel, BE (2004 - 2016)
  • Opwijk, BE (2014 - 2019)
  • Londerzeel, BE (2006 - 2021)
  • Santa Rosa, CA (US) (2017 - 2022)

Company Filing History:

goldMedal14 out of 561 
 
Keysight Technologies, Inc.
 patents
silverMedal5 out of 4,671 
 
Agilent Technologies, Inc.
 patents
bronzeMedal4 out of 832,812 
Other
 patents

Years Active: 2004-2024

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23 patents (USPTO):Explore Patents
1. 12158491 - Phase distortion measurement (2024-12-03),
2. 11268997 - Method and apparatus for characterizing homodyne transmitters and receivers (2022-03-08),
3. 11137445 - Method and apparatus for reducing non-linear distortion (2021-10-05),
4. 11057256 - Measurement of periodically modulated signals under non-coherent operating conditions (2021-07-06),
5. 10845401 - Nonlinear distortion detection (2020-11-24),
6. 10735036 - Method for measuring frequency offset between an RF transmitter and a test receiver (2020-08-04),
7. 10387592 - Method and system for characterizing, modeling and simulating non-linear components having long term memory effects (2019-08-20),
8. 10003419 - Method and system of preventing interference caused by images (2018-06-19),
9. 9793857 - Method and apparatus for characterizing local oscillator path dispersion (2017-10-17),
10. 9698919 - Method and apparatus for spectral stitching discontinuous spectra using reference channel, pilot tones and comb signal (2017-07-04),
11. 9673914 - Method and apparatus for spectral stitching using reference channel and a pilot tone (2017-06-06),
12. 9520954 - Method and system for characterizing phase dispersion in intermediate frequency channel of receiver (2016-12-13),
13. 9252895 - System and method of measuring full spectrum of modulated output signal from device under test (2016-02-02),
14. 8914271 - Method for predistorting signals for non-linear components in the presence of long term memory effects (2014-12-16),
15. 7295961 - Method for generating a circuit model (2007-11-13),

Title: The Innovative Mind of Jan Verspecht

Introduction: Jan Verspecht, a prolific inventor based in Londerzeel, Belgium, holds an impressive portfolio of 23 patents. His work focuses on advancements in measurement systems, particularly in the fields of optical signals and homodyne systems. Verspecht's contributions have made significant impacts in the technology sector, showcasing his expertise and innovative mindset.

Latest Patents: Among Jan Verspecht's latest patents is the "Phase Distortion Measurement," which introduces a test circuit designed to measure phase distortion using two lasers and a photo diode. This circuit generates multiple tones for precise analysis of optical signals. Another notable patent is the "Method and Apparatus for Characterizing Homodyne Transmitters and Receivers." This invention outlines a sophisticated method for measuring and correcting distortions in homodyne systems, enhancing their performance by providing accurate distortion estimates.

Career Highlights: Throughout his career, Jan Verspecht has worked with notable companies such as Keysight Technologies, Inc. and Agilent Technologies, Inc., where he has honed his skills in innovative technology development. His contributions have consistently reflected his dedication to enhancing electronic measurement and signal processing.

Collaborations: In his journey, Verspecht has collaborated with esteemed colleagues, including Troels Studsgaard Nielsen and Keith Frederick Anderson. These partnerships have undoubtedly enriched his work and fostered advancements across various technological applications.

Conclusion: Jan Verspecht stands out as an influential figure in the realm of invention and innovation. His 23 patents testify to his relentless pursuit of excellence and ability to solve complex challenges in technology. As he continues to push the boundaries of his field, Verspecht remains a valuable contributor to the advancement of measurement systems and beyond.

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