The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2024

Filed:

Jul. 27, 2022
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Jan Verspecht, Londerzeel, BE;

Bogdan Szafraniec, Sunnyvale, CA (US);

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2635 (2013.01); G01R 31/2633 (2013.01);
Abstract

A test circuit for measuring phase distortion includes a first laser, a second laser and a photo diode. The first laser is tuned to a first frequency fand generates a first optical signal. The second laser is tuned to a second frequency fand generates a second optical signal and phase modulates the second optical signal with a periodic signal with a repetition frequency fM. The photo diode receives and mixes the first optical signal and the second optical signal, and produces a first tone at a third frequency f, which is a carrier frequency equal to an absolute value of a difference between the second frequency fand the first frequency f, a second tone at a fourth frequency fat a difference between the third frequency fand the repetition frequency fM, and a third tone at a fifth frequency fat a sum of the third frequency fand the repetition frequency fM.


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