Enschede, Netherlands

Jan Greve, Legal Representative

This inventor holds 1 USPTO granted patent. Top assignee: Immunivest Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jan Greve, Legal Representative. Retrieved from https://idiyas.com/inventor/jan-greve-legal-representative

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Jan Greve: Innovating Image Analysis Techniques

Introduction: Jan Greve, a legal representative based in Enschede, Netherlands, has made significant contributions in the field of automated collection and image analysis through his patented inventions.

Latest Patents: Jan Greve holds one patent for "Devices and methods to image objects," which revolutionizes the identification and classification of microscopic objects by utilizing automated laser scanning techniques for imaging.

Career Highlights: Working at Immunivest Corporation, Jan Greve has showcased his expertise in developing innovative devices and methods for imaging objects. His dedication to advancing technology in image analysis has led to groundbreaking solutions for detecting, enumerating, differentiating, and characterizing imaged objects based on various parameters.

Collaborations: Jan Greve has collaborated with notable coworkers like Arjan Tibbe to further enhance the applications of his patented inventions. Together, they have worked towards refining the techniques for automated image analysis in various research and medical settings.

Conclusion: Jan Greve's commitment to innovation and his pioneering work in image analysis have positioned him as a leading figure in the field. His patented inventions not only showcase his technical proficiency but also emphasize his contributions to advancing scientific progress in automated image analysis technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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