The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Jul. 02, 2003
Applicants:

Arjan Tibbe, Deventer, NL;

Jan Greve, Oldenzaal, NL;

Leon W. M. M. Terstappen, Huntingdon Valley, PA (US);

Jan Greve, Legal Representative, Enschede, NL;

Inventors:

Arjan Tibbe, Deventer, NL;

Jan Greve, Oldenzaal, NL;

Leon W. M. M. Terstappen, Huntingdon Valley, PA (US);

Jan Greve, legal representative, Enschede, NL;

Assignee:

Immunivest Corporation, Wilmington, DE (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Devices and methods for automated collection and image analysis are disclosed that enable identification or classification of microscopic objects aligned or deposited on surfaces. Such objects, e.g. detectably labeled rare target cells, are magnetically or non-magnetically immobilized and subjected to automated laser scanning to generate sequential digitized x-y sub-images or partial images of target and non-target objects that are combined to form reconstructed full images, thereby allowing detection, enumeration, differentiation and characterization of imaged objects on the basis of size, morphology and immunophenotype.


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