James Siebert

Title: The Innovations of James Siebert

Introduction

James Siebert is a notable inventor based in San Jose, California. He has made significant contributions to the field of charged particle beam systems. His innovative work has led to the development of a patented technology that enhances the scanning control of these systems.

Latest Patents

James Siebert holds a patent for "Enhanced scanning control of charged particle beam systems." This invention involves a charged particle beam system capable of imaging and potentially editing a device under test (DUT). The system includes a charged particle beam generation unit, such as a focused ion beam (FIB) column, which emits a charged particle beam onto the DUT. The invention also features a scan controller arrangement that implements a finite state machine to control the application of the charged particle beam according to various scanning control parameters. These parameters can describe rectangular scan regions or other shapes through a bit-map. The method for controlling the scanning of a charged particle beam involves obtaining a set of scanning control parameters and directing the beam as specified.

Career Highlights

James Siebert is currently associated with Credence Systems Corporation, where he continues to innovate in the field of charged particle beam technology. His work has been instrumental in advancing the capabilities of imaging and editing devices under test.

Collaborations

Some of his notable coworkers include Lokesh Johri and Dennis McCarty, who have collaborated with him on various projects within the company.

Conclusion

James Siebert's contributions to the field of charged particle beam systems exemplify the spirit of innovation. His patented technology not only enhances imaging capabilities but also opens new avenues for device testing and editing.