James Schiel

Title: Innovations of James Schiel in Time-of-Flight Imaging

Introduction

James Schiel is an accomplished inventor based in Goleta, California. He has made significant contributions to the field of imaging technology, particularly through his innovative patent related to time-of-flight imaging.

Latest Patents

James Schiel holds a patent for "Methods and apparatus for time-of-flight imaging." This patent describes a method where scene depth is extracted from dual frequency of a cross-correlation signal. In this implementation, a camera illuminates a scene with amplitude-modulated light while sweeping the modulation frequency. Each camera pixel measures a cross-correlation of incident light and a reference electrical signal. The output from each pixel is a vector of cross-correlation measurements acquired during the sweep. A computer then performs a Fast Fourier Transform (FFT) on this vector, identifies a dual frequency at the second largest peak in the resulting power spectrum, and calculates scene depth based on a specific formula involving the speed of light.

Career Highlights

James Schiel is associated with the Massachusetts Institute of Technology, where he continues to push the boundaries of imaging technology. His work has garnered attention for its innovative approach to extracting depth information from scenes, which has potential applications in various fields, including robotics and autonomous vehicles.

Collaborations

James has collaborated with notable colleagues such as Achuta Kadambi and Ayush Bhandari, contributing to advancements in imaging technologies.

Conclusion

James Schiel's innovative work in time-of-flight imaging exemplifies the impact of modern inventions on technology. His contributions continue to influence the field and inspire future developments in imaging systems.