The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Feb. 13, 2017
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Achuta Kadambi, Cambridge, MA (US);

James Schiel, Goleta, CA (US);

Ayush Bhandari, Cambridge, MA (US);

Ramesh Raskar, Cambridge, MA (US);

Vage Taamazyan, Moscow, RU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2006.01); G01S 7/48 (2006.01); G01S 17/32 (2006.01); G01S 17/10 (2006.01); G01S 7/491 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 7/4915 (2013.01); G01S 17/10 (2013.01); G01S 17/32 (2013.01); G01S 17/325 (2013.01);
Abstract

In some implementations, scene depth is extracted from dual frequency of a cross-correlation signal. A camera may illuminate a scene with amplitude-modulated light, sweeping the modulation frequency. For each modulation frequency in the sweep, each camera pixel may measure a cross-correlation of incident light and of a reference electrical signal. Each pixel may output a vector of cross-correlation measurements acquired by the pixel during a sweep. A computer may perform an FFT on this vector, identify a dual frequency at the second largest peak in the resulting power spectrum, and calculate scene depth as equal to a fraction, where the numerator is the speed of light times this dual frequency and the denominator is four times pi. In some cases, the two signals being cross-correlated have the same phase as each other during each cross-correlation measurement.


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