This inventor holds 2 USPTO granted patents. Top assignee: General Electric Company. Active years: 1978-1979.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1978-1979
Title: Innovations of James M Lafferty
Introduction
James M Lafferty is a notable inventor based in Schenectady, NY (US). He has made significant contributions to the field of x-ray imaging and high-current vacuum switch technology. With a total of 2 patents to his name, Lafferty's work has had a considerable impact on these areas.
Latest Patents
Lafferty's latest patents include an "X-ray imaging apparatus with control mesh" and a "High-current vacuum switch with reduced contact erosion." The x-ray imaging apparatus features a gas-filled chamber bounded by a photocathode and a charge-receiving sheet anode. It incorporates a control mesh positioned in the gas-filled gap, which is maintained at a positive voltage to facilitate high avalanche amplification. This design achieves nearly constant efficiency of charge collection at the anode, independent of charge accumulation. The high-current vacuum switch patent addresses the issue of excessive contact erosion in high-current devices. By ensuring rapid transfer of the arc from the contacts to auxiliary electrodes, Lafferty's design minimizes erosion by using refractory metals for contacts and easily vaporized materials for auxiliary electrodes.
Career Highlights
Lafferty is associated with General Electric Company, where he has been able to apply his innovative ideas and technical expertise. His work has contributed to advancements in electrical engineering and imaging technologies.
Collaborations
One of Lafferty's notable collaborators is Kei-Hsiung Yang. Their partnership has likely fostered further innovations in their respective fields.
Conclusion
James M Lafferty's contributions to x-ray imaging and vacuum switch technology exemplify the spirit of innovation. His patents reflect a commitment to improving efficiency and performance in critical applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
